A Novel Simplified Measurement Procedure for 4-Pair 100 Ω Category 6 Connecting Hardware

• Main Authors: Chia-Hsun Wu, 吳家勳
• Other Authors: Shih-Hsiung Twu
• Format: Others
• Language: en_US
• Published: 2005
• Online Access: http://ndltd.ncl.edu.tw/handle/33917980658292689045

碩士 === 中原大學 === 電機工程研究所 === 93 === In this thesis, we propose a novel simplified procedure of measurement of high-frequency parameters of Category 6 connecting hardware electric characteristic. Traditionally, the measurement procedures of Test Plug are complicated so that it makes a long course time. Hence, we try to simplify the measurement procedures and equations. From the measurements of S-parameter and experiments by network analyzer, the simplified method verifies that it really reaches the goals we design. Connecting hardware measurement parameters include Insertion Loss (IL), Return Loss (RL), Near-end Crosstalk (NEXT), Far-end Crosstalk (FEXT) and Longitudinal Conversion Loss (LCL). The devices under test (DUT) include Test Plug and Jack. In order to measure NEXT and FEXT parameters efficiently, we simplify measurement procedures and equations of Test Plug. Our proposal includes the following procedures: (1) From the difference among CAT5, CAT5e and CAT6 measurement procedures, the range of qualification of Test Plug NEXT loss of our proposal is different from the standard one. (2) According the above simplified procedure, we measure the S-parameters and execute related experiments to verify our method. In conclusion, the simplified procedure not merely reduces the heavy and complex procedures, but also enables connecting hardware to obtain certain reliability. (3) Similarly, for Test Plug FEXT loss, we measure S-parameters and execute the related experiments by network analyzer and obtain some simplified equations. (4) The Test Plug FEXT loss simplified equations obtained from above procedures not merely simplify the procedures of measurement, but also can be used for calculating the relevant components of connecting hardware to shorten the measurement time. It is believed that our proposal can be applied to solve the problems of manufacturers encountered in the research and development of products. It can help them to shorten the development period, accelerate the studying progress, shorten the S-parameters measurement and calculation time and make the high quality products.