The Technical of Scanning Electron Microscope (SEM) Electron Gun Control
碩士 === 大葉大學 === 電機工程學系碩士在職專班 === 93 === Different from Optical Microscope (OM) which use normal light source with optical lens to get the image . Scanning Electron Microscope (SEM) use Electron Beam as light source and electromagnetic coil through scanning method to get the image. Due to E-beam wave...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/00011983701171066768 |