Empirical investigation of the relationship between interaction level metric and class defects

• Main Authors: Kuo-Hua Chung, 鐘國華
• Other Authors: Hewijin Christine Jiau
• Format: Others
• Language: en_US
• Published: 2005
• Online Access: http://ndltd.ncl.edu.tw/handle/00927535675041911057

碩士 === 國立成功大學 === 電腦與通信工程研究所 === 93 === 　The object-oriented paradigm has become popular in recent years. In order to better evaluate and control the quality of object-oriented software system, many object-oriented design metrics proposed to model the design properties that influence software quality during design phase. Many new metrics have been proposed, but only a few of them have been validated. The major focus of our work is to empirically investigate the relationship between class defect count and a better existing design complexity metric, Interaction Level (IL). Several open source projects are studied to perform such investigation. In addition, we also present the relationship between design complexity metric and class defect count by using software visualization technique. The result shows this metric can be a useful reliability indicator at the class level.