Application of two frequency fringe pattern for phase-shifting projected fringe profilometry

• Main Authors: Hong-Ming Chen, 陳宏名
• Other Authors: Wei-Hung Su
• Format: Others
• Language: zh-TW
• Published: 2005
• Online Access: http://ndltd.ncl.edu.tw/handle/85545266341890301010

碩士 === 國立中山大學 === 材料科學研究所 === 93 === A novel accurate calibration-based phase-shifting projected fringe profilometry (Calibration-based PSPFP) for finding the absolute shape of objects is proposed. In addition to a tremendous savings in time, the benefits of using Calibration-based PSPFP also include greatly reduced environmental vulnerability. Since Calibration-based PSPFP employs a sinusoidal fringe pattern to perform the phase-shifting algorithm, the quality and accuracy of the sinusoidal fringe pattern becomes critical. To evaluate the performance of this measurement scheme and reduce the phase error caused by projected fringes, fabrication of various digital sinusoidal fringe patterns is necessary. Thus, we propose a method to fabricate various digital patterns. Application of a 2-D fringe pattern for Calibration-based PSPFP is proposed as well.