High Speed Serial Transmission Media Testing
碩士 === 國立臺灣大學 === 電子工程學研究所 === 93 === Due to the limitation of clock skew, parallel communication has reached the bottleneck in terms of data transmission. As a result, parallel communication is gradually being replaced by high-speed serial communication. TDR is effective fault diagnosis instrument...
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| Format: | Others |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/11307374834461217681 |
| Summary: | 碩士 === 國立臺灣大學 === 電子工程學研究所 === 93 === Due to the limitation of clock skew, parallel communication has reached the bottleneck in terms of data transmission. As a result, parallel communication is gradually being replaced by high-speed serial communication.
TDR is effective fault diagnosis instrument for cable testing. However, it is not economical to identify whether the product is pass or fail in manufacturing testing. We proposed an economical testing technique to identify pass/fail of high speed transmission media.
To reduce the complexity of testing system, the relationship model of incident signal and reflective signal is build according to frequent fault characteristics and time domain reflectometry theorem. The requirement of high-speed devices is lower because high frequency signals can be sampled by low frequency using coherent under-sampling method. The testing cost has been reduced because the requirement of high-speed devices is lower.
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