The Study of Small-Displacement Measurement Based on the Surface Plasma Resonance Technique and Total Internal Reflection in Heterodyne Interferometry

碩士 === 清雲科技大學 === 電子工程研究所 === 94 === In this research, a novel instrument for measuring small displacement by uses of the surface plasma resonance (SPR) technology, the principles of total internal reflection (TIR) and heterodyne interferometry is presented. As a heterodyne light source focuses on a...

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Bibliographic Details
Main Authors: Jyh-Shyan Chiu, 邱智賢
Other Authors: Shinn-Fwu Wang
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/71913633630624902048

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