PIC model building technique for EMI prediction
碩士 === 逢甲大學 === 通訊工程所 === 95 === Varieties of electronic commodities bring us a convenient life, but these commodities make the environment with complicated electromagnetic noise. Therefore, the electromagnetic compatibility test of electronic commodities is singularly important. When Printed Circui...
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ndltd-TW-095FCU056500122015-10-13T11:31:40Z http://ndltd.ncl.edu.tw/handle/22484654968107225462 PIC model building technique for EMI prediction 應用於EMI之PIC電路建模技術 Jia-wen Luo 羅嘉文 碩士 逢甲大學 通訊工程所 95 Varieties of electronic commodities bring us a convenient life, but these commodities make the environment with complicated electromagnetic noise. Therefore, the electromagnetic compatibility test of electronic commodities is singularly important. When Printed Circuit Board’s layer increases, traditional method which welds shielding components on the circuit board to solve electromagnetic compatibility problem is not enough. This situation forces industry to estimate and handle EMI problem before system integration and try to estimate EMI in embedded system design flow. This thesis proposes a method to model microcontroller’s EMI behavior and illustrated by PIC12F629. First, a circuit board is implemented. The board design is according to EMI testing specification and can be used to measure the conducted Electromagnetic Interference. The microcontroller is loaded an elaborately designed infinite loop. Each instruction’s waveform is get by measuring VDD interference. Then ic-emc tool and winspice read these information and evaluate microcontroller’s model. Further more, we design microcontroller’s instruction set simulator from SID. This simulator can predict different program’s conducted Electromagnetic Interference. The prediction is quiet similar to the measurement result. Shih-yi Yuan 袁世一 2007 學位論文 ; thesis 97 zh-TW |
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碩士 === 逢甲大學 === 通訊工程所 === 95 === Varieties of electronic commodities bring us a convenient life, but these commodities make the environment with complicated electromagnetic noise. Therefore, the electromagnetic compatibility test of electronic commodities is singularly important. When Printed Circuit Board’s layer increases, traditional method which welds shielding components on the circuit board to solve electromagnetic compatibility problem is not enough. This situation forces industry to estimate and handle EMI problem before system integration and try to estimate EMI in embedded system design flow. This thesis proposes a method to model microcontroller’s EMI behavior and illustrated by PIC12F629. First, a circuit board is implemented. The board design is according to EMI testing specification and can be used to measure the conducted Electromagnetic Interference. The microcontroller is loaded an elaborately designed infinite loop. Each instruction’s waveform is get by measuring VDD interference. Then ic-emc tool and winspice read these information and evaluate microcontroller’s model. Further more, we design microcontroller’s instruction set simulator from SID. This simulator can predict different program’s conducted Electromagnetic Interference. The prediction is quiet similar to the measurement result.
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author2 |
Shih-yi Yuan |
author_facet |
Shih-yi Yuan Jia-wen Luo 羅嘉文 |
author |
Jia-wen Luo 羅嘉文 |
spellingShingle |
Jia-wen Luo 羅嘉文 PIC model building technique for EMI prediction |
author_sort |
Jia-wen Luo |
title |
PIC model building technique for EMI prediction |
title_short |
PIC model building technique for EMI prediction |
title_full |
PIC model building technique for EMI prediction |
title_fullStr |
PIC model building technique for EMI prediction |
title_full_unstemmed |
PIC model building technique for EMI prediction |
title_sort |
pic model building technique for emi prediction |
publishDate |
2007 |
url |
http://ndltd.ncl.edu.tw/handle/22484654968107225462 |
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