Synthesis and Characterization of Poly(amide-imide)s and Poly(ester-imide)s Containing Fluorene and 1,3,4-Oxadiazole

• Main Authors: Mei- Jhen Huang, 黃美珍
• Other Authors: Mou-Yung Yeh
• Format: Others
• Language: zh-TW
• Published: 2007
• Online Access: http://ndltd.ncl.edu.tw/handle/12102078938347705004

碩士 === 國立成功大學 === 化學系碩博士班 === 95 === Orangic lignt-emitting diodes (OLEDs) have recently attracted attention of their potential use in display technology, and then intrigued interests in both academic and industrial circles. However, polymer lignt-emitting diodes (PLED) have some aspects need further improvement. Now, many literator have synthesized some polymer containing isolated luminescent functional groups in order to improve color impurity because the effective length of conjugation Poly(amide-imide)s and poly(ester-imide)s are well known as high-perfor-mance polymeric materials because of they not only modified polyimides to improve processability and solubility, but also hold excellent thermal stable. In this work, poly(amide-imide)s and poly(ester-imide)s have preparated by direct polycondensation and low temperature solution polymerization from imide-containing monomers and diol or diamine, and 1,3,4 -oxadiazole and fluorene moieties by introducing into the polymer backbone. Test properties of the synthesized polymers, these polymers having intrinsic viscosity of 0.14~0.31dL/g were obtained. These polymers were soluble in aprotic polar solvents such as NMP, DMF, DMSO, even some of there were soluble in organic solvents. The temperature of 10％ weight loss of these polymers were in the range of 613~811K under nitrogen atmosphere.The emittive wavelengths of these polymers in NMP are located at 403~490 nm in the blue visible region. From cyclic voltammetric and optical investigations, and HOMO and LUMO level of P1~P15 are estimated to be-8.19~-7.38eV and -4.44~-3.88eV, respectively; except P7、P8、P12 and P13 show semicrystalline state, other polymers are were amorphous, as evidenced by the wide-angle X-ray diffraction measurements.