| Summary: | 碩士 === 國立交通大學 === 工業工程與管理系所 === 95 === Polymer light emitting diode (PLED) is generally stacked up by different kinds of materials of layers including PF layer, metal layer, and Indium Tin Oxide (ITO) layer. PLED panels can electrify themselves without any backlight system or lighting source. One advantage of using PLED panels is that people can see the text on panels from almost any angle of view. However, because of chemical reactions and materials, there are some kinds of defects occurred on panels such as non-uniformity of luminance, lack of chromaticity, and irregular rubber width.
One efficient way to detect the defects of PLED panels is the AOI system, which is used to inspect the image of defects on the panels.
Our research can be described in two parts. First, in order to compare the efficiency of colorimeter and CCD, we analyzed the results of measurement by using both of them. Second, we designed a set of hardware structure and algorithms for detecting the defect of non-uniformity luminance, lack of chromaticity, and irregular rubber width. We also verified the effectiveness of the proposed methods with several samples and experiments. Experimentation results showed that proposed AOI system has a good performance in PLED panel.
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