Measurement and Simulation of Transient Current for tenx™ MCU TM87P08
碩士 === 逢甲大學 === 產業研發碩士班 === 96 === The electromagnetic interference nowadays has arisen significantly. When a large number of digital signals switch simultaneously, numerous high-frequency energy (i.e. transient current) yields and produces electromagnetic interference to other devices. This thesis...
Main Authors: | hong-bin Chen, 陳宏賓 |
---|---|
Other Authors: | Shih-Yi Yuan |
Format: | Others |
Language: | zh-TW |
Published: |
2008
|
Online Access: | http://ndltd.ncl.edu.tw/handle/24342539438791253148 |
Similar Items
-
Measurement and Simulation of Transient Current for tenx™ TMU3101
by: Yu-Shone Yang, et al.
Published: (2008) -
VLSI Implementation of MCU for EMI Measurement
by: Wan-Jung Lin, et al.
Published: (2013) -
MCU encodes the pore conducting mitochondrial calcium currents
by: Dipayan Chaudhuri, et al.
Published: (2013-06-01) -
Power-on Reset Test for MCU
by: Yung-ming Yuan, et al.
Published: (2012) -
Design and Setup of MCU Encryption
by: 麥舜期
Published: (2009)