Investigation of Reliavility Issues in HfO2 Nanocrystal Flash Memory Cells

碩士 === 國立交通大學 === 電子工程系所 === 96 ===

Bibliographic Details
Main Authors:	Chih-Hsiiung Li, 李智雄
Other Authors:	Tahui Wang
Format:	Others
Language:	en_US
Published:	2007
Online Access:	http://ndltd.ncl.edu.tw/handle/60538393478372564411

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spelling	ndltd-TW-096NCTU54282212015-10-13T16:13:48Z http://ndltd.ncl.edu.tw/handle/60538393478372564411 Investigation of Reliavility Issues in HfO2 Nanocrystal Flash Memory Cells 二氧化鉿奈米晶體快閃式記憶元件可靠度分析 Chih-Hsiiung Li 李智雄　碩士國立交通大學電子工程系所 96 Tahui Wang 汪大暉 2007 學位論文 ; thesis 42 en_US
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
description	碩士 === 國立交通大學 === 電子工程系所 === 96 ===
author2	Tahui Wang
author_facet	Tahui Wang Chih-Hsiiung Li 李智雄
author	Chih-Hsiiung Li 李智雄
spellingShingle	Chih-Hsiiung Li 李智雄　 Investigation of Reliavility Issues in HfO2 Nanocrystal Flash Memory Cells
author_sort	Chih-Hsiiung Li
title	Investigation of Reliavility Issues in HfO2 Nanocrystal Flash Memory Cells
title_short	Investigation of Reliavility Issues in HfO2 Nanocrystal Flash Memory Cells
title_full	Investigation of Reliavility Issues in HfO2 Nanocrystal Flash Memory Cells
title_fullStr	Investigation of Reliavility Issues in HfO2 Nanocrystal Flash Memory Cells
title_full_unstemmed	Investigation of Reliavility Issues in HfO2 Nanocrystal Flash Memory Cells
title_sort	investigation of reliavility issues in hfo2 nanocrystal flash memory cells
publishDate	2007
url	http://ndltd.ncl.edu.tw/handle/60538393478372564411
work_keys_str_mv	AT chihhsiiungli investigationofreliavilityissuesinhfo2nanocrystalflashmemorycells AT lǐzhìxióng investigationofreliavilityissuesinhfo2nanocrystalflashmemorycells AT chihhsiiungli èryǎnghuàjiānàimǐjīngtǐkuàishǎnshìjìyìyuánjiànkěkàodùfēnxī AT lǐzhìxióng èryǎnghuàjiānàimǐjīngtǐkuàishǎnshìjìyìyuánjiànkěkàodùfēnxī
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Investigation of Reliavility Issues in HfO2 Nanocrystal Flash Memory Cells

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