| Summary: | 碩士 === 國立彰化師範大學 === 機電工程學系 === 96 === The quartz crystal oscillator (quartz oscillator) has been an important component in every electronic product for frequency control, especially to today’s information and communication industry, its steady performance quality can’t be replaced.
Using analyse method to estimate the products reliability, provided user in product design phase, using the reliability evaluated method to determine the products accept or reject rules with require specification for save time and more efficiency.
The regular system operation frequency is very important for vary modern electronic products. Therefore, in this study use the quartz crystal components to accelerate life test for research object. The service condition included working environment, operating voltage and ambient temperature adding the stress testing. It is attempt to get the product invalid data in short-time, with ALTA® software using data analysis to estimate the stretch environment product’s long life distribution and stepping accelerated force model parameter. To establish correct model and compute product using life decay situation. It could to figure out the quartz crystal component average using time in normal service condition.
In this case, we success get to estimate the quartz crystal product using time. That Mean Time to Failure (MTTF) is be evaluated at 3.3V and 5.0V operation voltage. When the destructiveness analysis, it could be know the high voltage with over current correction will broken-down the IC, make this research more meaningful.
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