The Characterization of the Vertical Sidewall MOSFETs with Smart Body-tie, Buried Block Layer, and Novel Embedded Gate

碩士 === 國立中山大學 === 電機工程學系研究所 === 96 === In this thesis, according to the development of the vertical MOSFETs, we propose several MOSFETs that possess vertical channels, double gates, and buried oxide to solve the defects of the applications in switch devices, CMOS technique, and power devices. The ve...

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Bibliographic Details
Main Authors: Tai-yi Lee, 李泰儀
Other Authors: Jyi-tsong Lin
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/s4hyez