Characterization of Erbium-doped ZnO prepared by Ion beam sputtering deposition

碩士 === 國立臺灣科技大學 === 電子工程系 === 96 === Erbium-doped ZnO films were deposited by ion-beam sputtering deposition. Alternate ZnO-Er layers were deposited on Si wafers utilizing individual ZnO and Er targets. This allows the mixing of Er into ZnO matrixes by thermal annealing. Under above bandgap excitati...

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Bibliographic Details
Main Authors: Chung-wen Chang, 張仲文
Other Authors: Liang-Chiun Chao
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/03341268133404057871

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