Fabrication of MEMS probe card using standard CMOS technology with flip chip solder bumps

碩士 === 國立臺北科技大學 === 機電整合研究所 === 96 === This thesis aims to combine MEMS process with micro electroforming technology to fabricate vertical spring-probe, which can be applied to wafer level probe card .This probe card includes a CMOS chip and a print circuit board. The said CMOS chip based on the sta...

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Bibliographic Details
Main Authors: Chang-Hsiu Wu, 吳昌修
Other Authors: Jung-Tang Huang
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/rmhj43

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