Investigation of annealing effects on PEDOT:PSS and P3HT:PCBM films by micro-Raman spectroscopy

• Main Authors: Yu-Ming Wang, 王毓閔
• Other Authors: Jenq-Nan Yih
• Format: Others
• Language: en_US
• Published: 2009
• Online Access: http://ndltd.ncl.edu.tw/handle/48679196843191123999

碩士 === 國立高雄應用科技大學 === 電機工程系 === 97 === We examined the effects of thermal annealing process on PEDOT:PSS and P3HT:PCBM films by means of micro-Raman spectroscopy and optical microscopy in order to provide more process parameters for improving organic solar cell. The experimental results show that the morphology of P3HT:PCBM films apparently altered, but PEDOT:PSS films appeared more stable during thermal annealing process. The P3HT in the composite film gradually crystallizes during annealing, and the film exhibits a PCBM aggregation of micro size after annealing. The morphology becomes altered more clearly for an extended period of time at high annealing temperature, which facilitates the phase separation of P3HT:PCBM films to enhance the mobility of carriers. According to the experiment, a proper parameter of thermal annealing for P3HT:PCBM films would be 150oC for 30 min.