AN ON-LINE BUILT-IN SELF-REPAIR MECHANISM FOR THE FIR FILTER
碩士 === 國立中興大學 === 資訊科學與工程學系所 === 97 === Because of the development of VLSI technology, the semiconductor process capability upgrade continuously follows the Moore’s law and the process capability has been jumped into nanometer field already. In this nanometer technology, there are more components ca...
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ndltd-TW-097NCHU53940592015-11-13T04:04:46Z http://ndltd.ncl.edu.tw/handle/22993355536433249998 AN ON-LINE BUILT-IN SELF-REPAIR MECHANISM FOR THE FIR FILTER 在線自我修復研究應用於有限脈衝響應濾波器 Yung-Yu Hung 洪永裕 碩士 國立中興大學 資訊科學與工程學系所 97 Because of the development of VLSI technology, the semiconductor process capability upgrade continuously follows the Moore’s law and the process capability has been jumped into nanometer field already. In this nanometer technology, there are more components can be condensed into a single chip than before. In the past, the system may be constructed by many chips on one PC board (i.e. System-On-Board), but now it can built a system in a single chip (i.e. System-On-Chip) because of the improvement of VLSI process. Hence, many consumer products with high portable, low power consumption and compact package have been produced. However the nanometer technology also brings many new issues and challenges to the device designer. The advantage of the nanometer technology is that it can accommodate more and more transistors in a limited size area. However, the number of I/O pin does not increase accordingly. Thus, the issue of testability and reliability are becoming more critical than before. In order to reduce the test cost and time, we have to build a Built-In Self-Test (BIST) circuit into a system. Nevertheless, it might induce another reliability issue although the testing issue has been solved. To cope with this problem, a Built-In Self-Repair (BISR) skill has been introduced and added into this research. Traditionally, the skill of BISR is usually applied in an off-line repair manner. There are few researches talking about the repair in an on-line real-time manner. In this thesis, we firstly introduce the BISR with an on-line real-time format. To demonstrate the efficiency of the research, we adopt the Finite Impulse Response Filter as an example. The experimental results show that system reliability has been increased with a few overhead, and the system recovery operation can be finished in one clock cycle. 黃德成 學位論文 ; thesis 73 zh-TW |
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碩士 === 國立中興大學 === 資訊科學與工程學系所 === 97 === Because of the development of VLSI technology, the semiconductor process capability upgrade continuously follows the Moore’s law and the process capability has been jumped into nanometer field already. In this nanometer technology, there are more components can be condensed into a single chip than before. In the past, the system may be constructed by many chips on one PC board (i.e. System-On-Board), but now it can built a system in a single chip (i.e. System-On-Chip) because of the improvement of VLSI process. Hence, many consumer products with high portable, low power consumption and compact package have been produced. However the nanometer technology also brings many new issues and challenges to the device designer.
The advantage of the nanometer technology is that it can accommodate more and more transistors in a limited size area. However, the number of I/O pin does not increase accordingly. Thus, the issue of testability and reliability are becoming more critical than before. In order to reduce the test cost and time, we have to build a Built-In Self-Test (BIST) circuit into a system. Nevertheless, it might induce another reliability issue although the testing issue has been solved. To cope with this problem, a Built-In Self-Repair (BISR) skill has been introduced and added into this research. Traditionally, the skill of BISR is usually applied in an off-line repair manner. There are few researches talking about the repair in an on-line real-time manner. In this thesis, we firstly introduce the BISR with an on-line real-time format. To demonstrate the efficiency of the research, we adopt the Finite Impulse Response Filter as an example. The experimental results show that system reliability has been increased with a few overhead, and the system recovery operation can be finished in one clock cycle.
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黃德成 |
author_facet |
黃德成 Yung-Yu Hung 洪永裕 |
author |
Yung-Yu Hung 洪永裕 |
spellingShingle |
Yung-Yu Hung 洪永裕 AN ON-LINE BUILT-IN SELF-REPAIR MECHANISM FOR THE FIR FILTER |
author_sort |
Yung-Yu Hung |
title |
AN ON-LINE BUILT-IN SELF-REPAIR MECHANISM FOR THE FIR FILTER |
title_short |
AN ON-LINE BUILT-IN SELF-REPAIR MECHANISM FOR THE FIR FILTER |
title_full |
AN ON-LINE BUILT-IN SELF-REPAIR MECHANISM FOR THE FIR FILTER |
title_fullStr |
AN ON-LINE BUILT-IN SELF-REPAIR MECHANISM FOR THE FIR FILTER |
title_full_unstemmed |
AN ON-LINE BUILT-IN SELF-REPAIR MECHANISM FOR THE FIR FILTER |
title_sort |
on-line built-in self-repair mechanism for the fir filter |
url |
http://ndltd.ncl.edu.tw/handle/22993355536433249998 |
work_keys_str_mv |
AT yungyuhung anonlinebuiltinselfrepairmechanismforthefirfilter AT hóngyǒngyù anonlinebuiltinselfrepairmechanismforthefirfilter AT yungyuhung zàixiànzìwǒxiūfùyánjiūyīngyòngyúyǒuxiànmàichōngxiǎngyīnglǜbōqì AT hóngyǒngyù zàixiànzìwǒxiūfùyánjiūyīngyòngyúyǒuxiànmàichōngxiǎngyīnglǜbōqì AT yungyuhung onlinebuiltinselfrepairmechanismforthefirfilter AT hóngyǒngyù onlinebuiltinselfrepairmechanismforthefirfilter |
_version_ |
1718127972780605440 |