Process development on high-k gate stack, spacer formation and SiGe growth for CMOS performance enhancement

博士 === 國立交通大學 === 機械工程系所 === 97 === In this work, gate stack formation for high-k materials, spacer process improvement and stress enhancement process before SiGe growth are proposed. The first two processes can improve the performance of pMOSFET and nMOSPET, and the third process can improve the p...

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Bibliographic Details
Main Authors: Cheng, Po-Lun, 鄭博倫
Other Authors: Hsu, Wensyang
Format: Others
Language:en_US
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/58480567650914265988