Research of optical recording bits on blu-ray disc

• Main Authors: Wen-Siou Lin, 林文秀
• Other Authors: Sy-Hann Chen
• Format: Others
• Language: zh-TW
• Published: 2009
• Online Access: http://ndltd.ncl.edu.tw/handle/30399885800640332462

碩士 === 國立嘉義大學 === 光電暨固態電子研究所 === 97 === This work investigates recording bits on recordable and rewriteable blu-ray discs using atomic force microscopy (AFM) and conducting atomic force microscopy (CAFM) with high contrast, respectively. The geometric structure of the recording bits is clearly observed in image, which, when coupled with cross-section analysis, yields precise bits dimensions, and edge horizontal extended length (EHEL) values. The microscopic results are a valuable reference for increasing the recognition rate of digital signals in optical storage media. Furthermore, such a rapid and convenient measuring mode is an indispensable research tool for developing new recording materials and improving formation mechanisms.