Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests
博士 === 國立清華大學 === 材料科學工程學系 === 97 ===
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ndltd-TW-097NTHU51590092015-10-13T13:11:50Z http://ndltd.ncl.edu.tw/handle/06521669387530779810 Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests 利用掃描式電子顯微鏡之微探針系統結合四點探針技術對於環境測試後之無鉛焊料進行電性分析與探討 Shih,Toung-Yi 石東益 博士 國立清華大學 材料科學工程學系 97 Duh,Jenq-Gong 杜正恭 2008 學位論文 ; thesis 197 en_US |
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NDLTD |
language |
en_US |
format |
Others
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sources |
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description |
博士 === 國立清華大學 === 材料科學工程學系 === 97 ===
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author2 |
Duh,Jenq-Gong |
author_facet |
Duh,Jenq-Gong Shih,Toung-Yi 石東益 |
author |
Shih,Toung-Yi 石東益 |
spellingShingle |
Shih,Toung-Yi 石東益 Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests |
author_sort |
Shih,Toung-Yi |
title |
Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests |
title_short |
Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests |
title_full |
Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests |
title_fullStr |
Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests |
title_full_unstemmed |
Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests |
title_sort |
electrical measurement by sem nano-probing system combined with four points probes (4pp) method for lead free solder after environment tests |
publishDate |
2008 |
url |
http://ndltd.ncl.edu.tw/handle/06521669387530779810 |
work_keys_str_mv |
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