Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests

博士 === 國立清華大學 === 材料科學工程學系 === 97 ===

Bibliographic Details
Main Authors:	Shih,Toung-Yi, 石東益
Other Authors:	Duh,Jenq-Gong
Format:	Others
Language:	en_US
Published:	2008
Online Access:	http://ndltd.ncl.edu.tw/handle/06521669387530779810

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spelling	ndltd-TW-097NTHU51590092015-10-13T13:11:50Z http://ndltd.ncl.edu.tw/handle/06521669387530779810 Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests 利用掃描式電子顯微鏡之微探針系統結合四點探針技術對於環境測試後之無鉛焊料進行電性分析與探討 Shih,Toung-Yi 石東益博士國立清華大學材料科學工程學系 97 Duh,Jenq-Gong 杜正恭 2008 學位論文 ; thesis 197 en_US
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
description	博士 === 國立清華大學 === 材料科學工程學系 === 97 ===
author2	Duh,Jenq-Gong
author_facet	Duh,Jenq-Gong Shih,Toung-Yi 石東益
author	Shih,Toung-Yi 石東益
spellingShingle	Shih,Toung-Yi 石東益 Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests
author_sort	Shih,Toung-Yi
title	Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests
title_short	Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests
title_full	Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests
title_fullStr	Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests
title_full_unstemmed	Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests
title_sort	electrical measurement by sem nano-probing system combined with four points probes (4pp) method for lead free solder after environment tests
publishDate	2008
url	http://ndltd.ncl.edu.tw/handle/06521669387530779810
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Electrical Measurement by SEM Nano-probing System Combined with Four Points Probes (4pp) Method for Lead Free Solder after Environment Tests

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