Spectroscopic Study of xSr(Mg1/3Ta2/3)O3-(1-x)Ba(Mg1/3Ta2/3)O3 Microwave Materials

碩士 === 國立臺灣師範大學 === 物理學系 === 97 === X-ray diffraction (XRD), extend x-ray absorption fine structure (EXAFS), Raman scattering, and infrared reflection spectroscopy were adopted to analyze the correlation of microwave properties with the microstructural parameters of xSr(Mg1/3Ta2/3)O3-(1-x)Ba(Mg1/3Ta...

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Bibliographic Details
Main Authors: I-Hao Chang, 張益豪
Other Authors: Chih-Ta Chia
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/43504665674179745866

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