A Study of the Equivalent Circuit for the TEM Cell

• Main Authors: Tsung-ChihChen, 陳宗志
• Other Authors: Kwong-Kau Tiong
• Format: Others
• Language: zh-TW
• Published: 2009
• Online Access: http://ndltd.ncl.edu.tw/handle/22069131663847564572

碩士 === 國立臺灣海洋大學 === 電機工程學系 === 97 === Electromagnetic Compatibility (EMC) is becoming a more and more important issue in the manufacturing process due to the continuous development of the IC industry. The ever increasing complexity of IC designs has brought EMC problem into the spotlight. The EMC technology has shown that crosstalk is more and more serious and it is almost the main source of the radiation in the entire electronic system. In this thesis, TEM cell has been used to evaluate the electromagnetic radiation interference level according to IEC 61967-2, and analyzed the Electromagnetic Interference (EMI) and the Electromagnetic Susceptibility (EMS) of the IC. In this thesis, the fundamental Maxwell equations, transmission line theory, and parallel plate waveguide theory were used to explain the electromagnetic field propagation mode of the TEM cell. The simulation and analysis of TEM cell was done by the electromagnetic field simulation tool, CST MICROWAVES STUDIO. Through the simulation process, an equivalent circuit representative of the TEM cell consisting of effective capacitors and inductors can be derived. The simulated equivalent circuit for the TEM was then compared with the measured results in the frequency range from 100 to 1000 MHz. The discrepancy between the simulated and measured results is about 24.2 % for the lower frequency range of below 300 MHz and for higher frequency range between 300 to 1000 MHz, the correlation is in general fall within 3 to 5.19 %.