Process Monitoring for LCD Defect Inspectionwith Line-Scan Cameras

• Main Authors: Wei-Shui Chen, 陳威旭
• Other Authors: Chiou-Shann Fuh
• Format: Others
• Language: en_US
• Published: 2009
• Online Access: http://ndltd.ncl.edu.tw/handle/58426398812513587312

碩士 === 國立臺灣大學 === 資訊網路與多媒體研究所 === 97 === In this thesis, we develop a process monitoring algorithm to detect whether the processes running on the LCD defect inspection system fail or are unusually busy and thereafter correct them. We aim to implement this method on the LCD (Liquid Crystal Display) defect inspection system with line-scan cameras. Because current LCD defect inspection systems comprise many CCD (Charge-Coupled Device) cameras and transferring image data to industrial computers with Camera Link for further processing, the algorithm must be simple, fast, and with low computational complexity to fit in with real-time environment. Another important issue in process status determination is how to minimize false alarm rate of the criteria we design.