RTA Growth and Characterization onCrystallographic, Optical and ElectricalProperties of ZnO:Ga Films

碩士 === 南台科技大學 === 機械工程系 === 97 === The purpose of this study is to investigate the influences of different proportion of doping (0.5~10%) and different growth behaviors on the micro-structural, optical and electrical properties of ZnO thin films and to find the best proportion of doping so that high...

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Bibliographic Details
Main Authors: Yu-Yu Chen, 陳育裕
Other Authors: Ken-moh Lin
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/73107350964987489758
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Summary:碩士 === 南台科技大學 === 機械工程系 === 97 === The purpose of this study is to investigate the influences of different proportion of doping (0.5~10%) and different growth behaviors on the micro-structural, optical and electrical properties of ZnO thin films and to find the best proportion of doping so that high quality of transparent conductive films can be obtained. In this experiment, the precursor was prepared by sol-gel method. First, Zinc acetate dehydrate was added into methanol. Then, MEA was added as stabilizer. Afterwards, adequate amount of metallic ions (Ga) were added to increase carrier concentration so that conductivity could be enhanced, too. Next, spin-coating was carried out on a glass substrate (corning 1737). After heat-treatments, the films were obtained. Both Ga doped ZnO and Al doped ZnO provide one electron (Ga3+or Al3 to substitute Zn2+) to increase the carrier concentration and lower the resistance. Since the radius of Ga ion (0.62 Å ) is similar to the radius of Zn ion (0.74 Å ), lattices are not easily deformed during the process of doping. Besides, Ga and Zn have similar electronegativity (Ga:1.13, Zn:0.99). Thus, as doping Ga is more suitable than Al. The specimens were analyzed by SE, UV-Vis-NIR, Hall, XRD, XPS and SEM . Experimental results show that the lowest resistance, 2.2×10-3Ω-cm , was obtained with 1.0 at.% Ga. The transmittance of the GZO films was over 80% . The crystallographic orientation of the GZO films shows the preferred direction of (002) and (103). XPS data show that the infrared heating process can efficiently enhance the production of oxygen vacancy when the doped films were annealed under vacuum.