A study of Reliability Test for Green Semiconductor Assembly

碩士 === 國立高雄應用科技大學 === 化學工程與材料工程系 === 98 === Due to the European Union had officially launched the RoHS(Restriction of the use of certain Hazardous Substances in Electrical and Electronic Equipment)directions in July, 2006, it forbids using the bans lead(Pb), Cadmium(Cd), Mercury(Hg), Hexavalent Chro...

Full description

Bibliographic Details
Main Authors: Yu-Chen Wu, 伍玉真
Other Authors: Tsung-Han Ho
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/44403383740978200318
id ndltd-TW-098KUAS8063009
record_format oai_dc
spelling ndltd-TW-098KUAS80630092015-10-13T18:58:40Z http://ndltd.ncl.edu.tw/handle/44403383740978200318 A study of Reliability Test for Green Semiconductor Assembly 環保型半導體封裝材料之可靠度研究 Yu-Chen Wu 伍玉真 碩士 國立高雄應用科技大學 化學工程與材料工程系 98 Due to the European Union had officially launched the RoHS(Restriction of the use of certain Hazardous Substances in Electrical and Electronic Equipment)directions in July, 2006, it forbids using the bans lead(Pb), Cadmium(Cd), Mercury(Hg), Hexavalent Chromium(Cr+6), Polybrominated Biphenyls(PBBs) and Polybrominated biphenyl ethers(PBDEs) in electronic products. Since Pb was largely been used in Electrical and Electronic products, in order to meet the RoHS requirements of Pb-free, assembly house changed the solder material from Sn/Pb to Pb-free, and raised the IR reflow temperature from 240℃ to 260℃. The internal trace moisture of IC package cause the popcorn issue happen because of instant temperature on IR reflow, or the internal thermal stress of IC package cause the delamination happen because differences in coefficient of thermal expansion(CTE) between molding compound and IC, and cause of the IC package failure. The purpose of this research is to choose a suitable Epoxy Molding Compound (EMC) and silver epoxy to package SOP8(150mil), hoping to enhance the reliability of IC package. First of all, choose three kinds of silver epoxy to probe into the thermal curing behavior by DSC, observe the microscopic structure by SEM, study the adhesion by Die Shear experiment as well as the influence of silver epoxy thickness on the reliability of chip. Second, further match three kinds of EMC to probe into the thermal curing behavior by DSC and observe the microscopic structure of curing EMC by SEM. Finally, use these three kinds of silver epoxy and EMC of green material to package SOP8(150mil) chip, then perform the reliability test of absorption and de-sorption, IR reflow test etc., in addition to explore its unique nature and find the best EMC and silver epoxy to meet the requirements of RoHS. Tsung-Han Ho 何宗漢 2009 學位論文 ; thesis 73 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立高雄應用科技大學 === 化學工程與材料工程系 === 98 === Due to the European Union had officially launched the RoHS(Restriction of the use of certain Hazardous Substances in Electrical and Electronic Equipment)directions in July, 2006, it forbids using the bans lead(Pb), Cadmium(Cd), Mercury(Hg), Hexavalent Chromium(Cr+6), Polybrominated Biphenyls(PBBs) and Polybrominated biphenyl ethers(PBDEs) in electronic products. Since Pb was largely been used in Electrical and Electronic products, in order to meet the RoHS requirements of Pb-free, assembly house changed the solder material from Sn/Pb to Pb-free, and raised the IR reflow temperature from 240℃ to 260℃. The internal trace moisture of IC package cause the popcorn issue happen because of instant temperature on IR reflow, or the internal thermal stress of IC package cause the delamination happen because differences in coefficient of thermal expansion(CTE) between molding compound and IC, and cause of the IC package failure. The purpose of this research is to choose a suitable Epoxy Molding Compound (EMC) and silver epoxy to package SOP8(150mil), hoping to enhance the reliability of IC package. First of all, choose three kinds of silver epoxy to probe into the thermal curing behavior by DSC, observe the microscopic structure by SEM, study the adhesion by Die Shear experiment as well as the influence of silver epoxy thickness on the reliability of chip. Second, further match three kinds of EMC to probe into the thermal curing behavior by DSC and observe the microscopic structure of curing EMC by SEM. Finally, use these three kinds of silver epoxy and EMC of green material to package SOP8(150mil) chip, then perform the reliability test of absorption and de-sorption, IR reflow test etc., in addition to explore its unique nature and find the best EMC and silver epoxy to meet the requirements of RoHS.
author2 Tsung-Han Ho
author_facet Tsung-Han Ho
Yu-Chen Wu
伍玉真
author Yu-Chen Wu
伍玉真
spellingShingle Yu-Chen Wu
伍玉真
A study of Reliability Test for Green Semiconductor Assembly
author_sort Yu-Chen Wu
title A study of Reliability Test for Green Semiconductor Assembly
title_short A study of Reliability Test for Green Semiconductor Assembly
title_full A study of Reliability Test for Green Semiconductor Assembly
title_fullStr A study of Reliability Test for Green Semiconductor Assembly
title_full_unstemmed A study of Reliability Test for Green Semiconductor Assembly
title_sort study of reliability test for green semiconductor assembly
publishDate 2009
url http://ndltd.ncl.edu.tw/handle/44403383740978200318
work_keys_str_mv AT yuchenwu astudyofreliabilitytestforgreensemiconductorassembly
AT wǔyùzhēn astudyofreliabilitytestforgreensemiconductorassembly
AT yuchenwu huánbǎoxíngbàndǎotǐfēngzhuāngcáiliàozhīkěkàodùyánjiū
AT wǔyùzhēn huánbǎoxíngbàndǎotǐfēngzhuāngcáiliàozhīkěkàodùyánjiū
AT yuchenwu studyofreliabilitytestforgreensemiconductorassembly
AT wǔyùzhēn studyofreliabilitytestforgreensemiconductorassembly
_version_ 1718037941072166912