Girdless Track Routing and Layer Assignment for Critical Area Reduction

碩士 === 國立交通大學 === 資訊科學與工程研究所 === 98 === An increasing interest has been drawn in the design for manufacturing (DFM) problems. One of the heavily surveyed DFM problems is the formulation and reduction of critical area for random defects. The effect of random defects, which do not shrink with the manu...

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Bibliographic Details
Main Authors: Lee, Yu-Wei, 李育維
Other Authors: Li, Yih-Lang
Format: Others
Language:en_US
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/77414344980277511783

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