Built-In Self-Tests for Jitter Measurement of Phase-Locked Loops
博士 === 國立交通大學 === 電控工程研究所 === 98 === Signal quality of data transmission is significantly affected by clock jitter of Phase-Locked Loops (PLLs). However, production test for clock jitters is too expensive to implement. Built-In Self-Test (BIST) for clock jitter measurement becomes an alternative sol...
Main Authors: | Hsu, Jen-Chien, 徐仁乾 |
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Other Authors: | Su, Chau-Chin |
Format: | Others |
Language: | en_US |
Published: |
2010
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Online Access: | http://ndltd.ncl.edu.tw/handle/30982847436181675801 |
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