Conditional Threshold Wear-leveling Algorithm for Multi-channel NAND Flash Memory
碩士 === 國立清華大學 === 電機工程學系 === 98 === Recently, NAND flash memory has become a widely used data storage media. However, it has the endurance problem that each NAND flash block has limited erase cycles. Erase failure usually first occurs over 10K-100K erase cycles. This is inherent endurance characteri...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/76661926878077785653 |