Automatic Labeling of Patent Document Clusters

• Main Authors: LIN,YI CHEN, 林宜貞
• Other Authors: Chen,Tsung-Teng
• Format: Others
• Language: zh-TW
• Published: 2010
• Online Access: http://ndltd.ncl.edu.tw/handle/35973386406487590359

碩士 === 國立臺北大學 === 資訊管理研究所 === 98 === The study develops an automatic labeling system that may derive proper labels for the patent documents of the same classification. The algorithm used by the system is based on the kernel functions and the mutual information calculated from adjacent words. The system can extract the representative key phrases from the patent documents of the same classification that collected from the United States Patent and Trademark Office. The accuracy the labels is evaluated by applying several benchmark indicators. The results of the study show that the accuracy of key phrases approximately reaches eighty percent. The top ranked key phrase approximately reaches fifty percent of matching accuracy. The results show the key phrases derived by the system agree with the USPTO classification scheme.