| Summary: | 碩士 === 臺灣大學 === 機械工程學研究所 === 98 === Electronic connectors are indispensable products in modern society. In order to improve the reliability of electronic connectors, the major failure mechanisms of connectors have to be found and how they affect the life and reliability of connectors have to be studied. Based on experience of manufacturers, the stress relaxation behavior of connector pins is one of the major failure mechanisms of the connector. Therefore, a two-mm hard metric connector is taken as an example. The stress relaxation behavior of connector pins and its relation to life and reliability of the connectors are studied in detail in the present study. The study is divided into two parts. The first part is to find relaxation of the pin’s contact force in an average sense. Based on a certain failure criterion, the life of pins when used in harsh environments can be found. The life of pins when used in normal environments can be evaluated as well through an accelerated model. The second part of the study is to find relaxation of normal force by considering all connector pins as a population and each pin as a sample individual. Uncertainties of several parameters in the force relaxation model are taken into consideration. Reliability theories are applied to find the reliability indexes of connector pins when they are used in harsh environments. The reliability indexes of pins when they are used in normal environments can be evaluated as well through an accelerated model. The normal environments include conditions of 30 ℃, 40 ℃and 50 ℃. The result indicates that temperature does make a great influence on the force relaxation behavior of connector pins as well as their life and reliability. Choosing appropriate material that has better relaxation behavior and letting connectors be operated at appropriate temperatures will improve the reliability of connectors.
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