The Study of applying TRIZ for solving computer integrated manufacturing problem

碩士 === 國立交通大學 === 管理學院碩士在職專班工業工程與管理組 === 99 === Computer integrated manufacturing system (CIMS) is commonly used to promote the product efficiency and the product quality in a modern wafer fab. Because the CIMS is so complex that when something wrong occurred, it is hard to make decision for trouble...

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Bibliographic Details
Main Authors: Lin, Sam, 林瑋倉
Other Authors: Perng, Der-Baau
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/80686660404188336566
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Summary:碩士 === 國立交通大學 === 管理學院碩士在職專班工業工程與管理組 === 99 === Computer integrated manufacturing system (CIMS) is commonly used to promote the product efficiency and the product quality in a modern wafer fab. Because the CIMS is so complex that when something wrong occurred, it is hard to make decision for trouble shooting. This thesis proposed a systematic approach to help engineers in solving this situation. A wafer fab. is used as an example to show how the proposed approach, based on the knowledge of wafer manufacturing, can integrate the TRIZ and QC story methods to solve this problem. The proposed approach used QC story method for problem diagnosis and generated a solution framework following the decision rule of TRIZ method. Finally, a better solution was suggested to the engineer for the encountered problem.