Analysis on the Deflection of Multilayered Ceramic Capacitors under High Temperature and Uniform Pressure

• Main Authors: Pei-Ling Guo, 郭姵伶
• Other Authors: JEN MING HUA
• Format: Others
• Language: zh-TW
• Published: 2011
• Online Access: http://ndltd.ncl.edu.tw/handle/99562113868749674585

碩士 === 國立中山大學 === 機械與機電工程學系研究所 === 99 === The complicated process may cause the internal defects of multi-layered ceramic capacitors (MLCCs) and result in the malfunctions. This work aims to investigate the deformations of MLCCs that composed of nearly a hundred of BaTiO3 and Ni electrode films interleaved and stacked due to high pressure at elevated temperature. This study focuses on theoretical and numerical analyses. Classical laminated plate theory, linear elastic assumptions and equilibrium equations were adopted. Associated with the texts by Timoshenko and practical manufacturing process, three types of boundary conditions were considered, such as all edges simple-supported, two opposite edges simple-supported and the other two free, and four edges free. Also, two more conditions need be added, including four fixed points at corners and the elastic foundation at bottom. The numerical simulation by finite element method (FEM) incorporated with software ANSYS was used to obtain the displacement field of MLCCs due to high pressure at elevated temperature. The MLCCs were divided into nine regions with suitably different boundary conditions. Compared with the numerical results the analytical solutions of nine regions were found satisfactorily acceptable, i.e., the errors were about 0.1% - 6.2% for the boundary conditions of four edges free and four corners fixed. The errors about 0.13% - 6.15% were also acceptable for the boundary conditions of two opposite edges simple-supported and the others free. However, the analytical solutions did not agree with the numerical results for the case of all the boundary conditions simple-supported. Finally the proposed theoretical methodology provides an analytical method alternatively, instead of FEM and ANSYS, to analyze a nearly hundred layered MLCCs.