Study on the glass defects measurements using the critical angle method and a CCD camera
碩士 === 國立虎尾科技大學 === 光電與材料科技研究所在職專班 === 99 === The purpose of this thesis is to combine the critical angle method with CCD image capture technology for measuring the scratches on the LCD glass substrate. The panels of mobile phones, LCD TVs, digital cameras and tablet PCs etc with glass substrates ar...
Main Authors: | Chien-Chen Lee, 李建成 |
---|---|
Other Authors: | 邱銘宏 |
Format: | Others |
Language: | zh-TW |
Published: |
2011
|
Online Access: | http://ndltd.ncl.edu.tw/handle/2bn5mv |
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