An Application of Grey System Model for Forecasting Semiconductor Packaging and Testing: A Case Study of P Company

• Main Authors: HSU-CHANG HUNG, 徐昌宏
• Other Authors: Hsien-Lun Wong
• Format: Others
• Language: zh-TW
• Published: 2012
• Online Access: http://ndltd.ncl.edu.tw/handle/74009443686920098254

碩士 === 明新科技大學 === 企業管理研究所在職專班 === 100 === This study proposes Grey System models (GM) for forecasting semiconductor packaging and testing “P Company” in Taiwan. The MAPE, MSE and Theil’U inequality coefficient are used to evaluate the predictive errors of the models proposed. The time series data is obtained from SAP System of “P Company”. The empirical results show that will Data during 2006 to 2011, NGBM model has better predictive performance than GM(1,1) model. In this research we confirmed that the prediction error rate of the GM is less than 10%, therefore, that it can be applicable to medium-term time service data forecasting.