Design of Optical Path and Mechanism for High Sensitivity Moiré Interferometry
碩士 === 國立成功大學 === 工程科學系專班 === 100 === Moiré interferomety is a reliable method for measuring IC package of deformation. As people today have increasing demands for slim and light electronic products, due to the limitation of the products’ size, it is necessary for the IC to reduce the length and thi...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/96104411139334523062 |