Growth and Characterizations of Low Temperature GaN Epilayers Using Two-Heater MOCVD Reactor

碩士 === 國立交通大學 === 電子物理系所 === 100 === In this theses, we use the home-made two-heater MOCVD reactor to grow low-growth temperature(850 ℃) GaN (LT-GaN) thin films. The electrical and optical properties of these samples were investigated by Hall, X-ray diffraction and photoluminescence measurements. Ha...

Full description

Bibliographic Details
Main Author: 陳永翔
Other Authors: 陳衛國
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/94735309950732283879

Similar Items