| Summary: | 碩士 === 國立交通大學 === 光電工程學系 === 100 === High resolution active light sensing pixel circuits have drawn great attention abidingly because they can amplify the sensing signals. It can be applied in many important domains, such as X-ray flat panel imager. Using thin film transistors on glass substrates as the amplifying and switching devices in pixel circuit, a large area panel is achievable. Nevertheless, the process variation or the degradation in long-term operation device can result in the sensing error. If a complicated circuit is used to compensate the variation, the resolution of the imager cannot be made high.
In this thesis, for both the two operation modes of snap-shot and rolling-readout, we propose the voltage-programmed and current- programmed circuits for the device variation compensation, respectively. The simulation is used to verify the compensating performance of these circuits. In addition, their merits and drawbacks are compared. Through the research, we develop the light sensing circuits implemented by the fewest TFTs with device variation compensating function. The circuits can meet the requirement for the high resolution flat panel imager, and minimized the errors resulting from threshold voltage shift.
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