Study on Electrical Characteristics and Physical

博士 === 國立交通大學 === 光電工程學系 === 100 === In order to investigate the mechanism of photo leakage current of poly-Si TFT, the poly-Si TFTs with patterned metal shielding layer are used to study. The location of the exposed region in poly-Si layer is defined by employing the proposed structure. The expose...

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Bibliographic Details
Main Authors: Li, Hung-Wei, 李泓緯
Other Authors: Tai, Ya-Hsiang
Format: Others
Language:en_US
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/51023890582627107516

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