Effects of White Light Bias on Incident Photon-to-Electron Collection Efficiency Measurement of Space-Charge-Limited Photovoltaic Devices

碩士 === 國立清華大學 === 電子工程研究所 === 100 === We developed an easy and accurate method for incident photons-to-electrons conversion efficiency(IPCE)measurement of space-charge-limited (SCL) photovoltaic devices. An extra white light bias is usually introduced in IPCE system to obtain the correct IPCE of SCL...

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Bibliographic Details
Main Authors: Chen, Chun-Nan, 陳俊男
Other Authors: Horng, Sheng-Fu
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/81104279326691144584