A Study on TeO2 Nanostructure RRAM Device

碩士 === 國立臺灣大學 === 應用物理所 === 100 === In this thesis, a resistive random-access memory was fabricated by using the tellurium dioxide. The nanostructure of the tellurium dioxide was grown on the p-type silicon substrate in a high-temperature furnace. Scanning electron microscopy, Photoluminescence a...

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Bibliographic Details
Main Authors: Hung-Sen Kang, 康閎森
Other Authors: Yuan-Huei Chang
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/05581999738280561434