The TFT-LCD Quality Evaluation in High Temperature Operation

• Main Authors: Shih-Kai Wei, 魏士凱
• Other Authors: 江行全
• Format: Others
• Language: zh-TW
• Online Access: http://ndltd.ncl.edu.tw/handle/41413556577832813175

碩士 === 元智大學 === 工業工程與管理學系 === 100 === In “Reliability Verification” high temperature operation test is mainly to accelerate aging to product, so to understand the environmental tolerance or to filter premature mortality of the product. Hence, in the liquid crystal display industry, designers often use this test to observe the impact of high temperature on the electronic components and materials, to see whether it result in defects or loss of function of the product. This research mainly is to investigate the intermittent flickering problem in display abnormal item, and to use “design of experiment” to analyze key operating variables on high temperature operation test in liquid crystal display module. Adopting a case study of the TFT-LCD testing industry, the main variations are temperature, pattern, frame rate and time. Meanwhile they are also the main operating conditions on the driving circuit load in the liquid crystal display module. Verifying the results of this research, we found display abnormal item dropped about 73.87%, which means in realistic terms a reduction of $10,000 USD of quality failure costs and 292 hours repair time. Also rewards can go to research and development personnel for improvement on the driving circuit.