XFEM Simulation of Channeling Crack Propagation in a Thin Film/Substrate System

碩士 === 元智大學 === 機械工程學系 === 100 === The extended finite element method (XFEM)is extended from the conventional finite element method. In the simulation of crack growth, it does not need a clear definition of the fracture surface and does not have to be remeshed. In the present work, the extended fin...

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Bibliographic Details
Main Authors: Hsueh-Chun Lu, 呂學俊
Other Authors: N.Yu
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/76535666359916847284
Description
Summary:碩士 === 元智大學 === 機械工程學系 === 100 === The extended finite element method (XFEM)is extended from the conventional finite element method. In the simulation of crack growth, it does not need a clear definition of the fracture surface and does not have to be remeshed. In the present work, the extended finite element method is employed to simulate the propagation of a matrix crack in a thin film/substrate system subjected to uniaxial tensile stresses. The stress intensity factors are computed and compared with the results obtained by fracture mechanics. In addition, the crack propagation is simulated.