| Summary: | 碩士 === 國立交通大學 === 光電工程研究所 === 101 === In viewpoint of computational efficiency, ray tracing based on geometric model is a convenient but effective way to analyze the performance of an optical system. However, neglect of diffraction effect may leads to the error of optical modeling-. In order to overcome this defect, we use the Wigner distribution function (WDF) as a tool, based on statistics and Fourier optics, to address the correspondence between WDF and light field technique. On account of macroscopic conditions, WDF could be proved equivalent to light field including diffraction effect. After discussing the WDF, we examine the physical significance of its Fourier dual – Ambiguity function (AF) associated with optical transfer function. The connection between AF and WDF in optical system will be given. Finally, we employ WDF analyses in extending depth of field (EDoF) system.
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