Backside Via Hole Process for Grounding GaAs HEMTs by Using ICP Dry Etching

碩士 === 國立交通大學 === 材料科學與工程學系 === 101 === This study focuses on ICP dry etching optimization for via hole structure of GaAs/AlGaAs/InGaAs pHEMTs and investigation of grounding GaAs HEMTs. The etching process of the via hole structure for GaAs substrate was optimized to obtain ideal via hole profiles w...

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Bibliographic Details
Main Authors: Wu, Ching-Feng, 吳青峰
Other Authors: Chang, Edward-Yi
Format: Others
Language:en_US
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/61271534951391544898

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