Investigation and Analysis of FinFET and Trigate Devices, Logic and Analog Circuits, and SRAM
碩士 === 國立交通大學 === 電子研究所 === 101 === In this thesis, we present a comprehensive comparative analysis of FinFET and Trigate in terms of device characteristics, stability of 6T SRAM cell, logic circuits and Widlar current source. The critical intrinsic random variations, including fin Line Edge Rou...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2012
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/66372196298044298147 |