A Bayesian reliability analysis of accelerated degradation test for destructive devices
碩士 === 國立中央大學 === 統計研究所 === 101 === In this thesis, we consider the accelerated destructive degradation test (ADDT) in which the degradation characteristic is the major indicator of the product failure. We discuss the products whose degradation characteristic is of lognormal distribution with mean b...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/95899426153496101120 |