Scrutinizing Au nanoparticle arrays with scattering-type scanning near-field optical microscopy
博士 === 國立臺灣大學 === 光電工程學研究所 === 101 === Anomalous optical properties displayed by plasmonic structures are commonly attributed to the enhanced, local field within their corrugations. Though theoretical calculations of such field enhancements abound, experimental observations are relatively few, beca...
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ndltd-TW-101NTU051241342015-10-13T23:10:17Z http://ndltd.ncl.edu.tw/handle/41981355563684579887 Scrutinizing Au nanoparticle arrays with scattering-type scanning near-field optical microscopy 散射式近場光學顯微鏡對奈米金粒子陣列之研究 Tian-You Cheng 鄭天佑 博士 國立臺灣大學 光電工程學研究所 101 Anomalous optical properties displayed by plasmonic structures are commonly attributed to the enhanced, local field within their corrugations. Though theoretical calculations of such field enhancements abound, experimental observations are relatively few, because only few optical microscopic techniques have enough spatial resolution. The scattering-type scanning near-field optical microscope (s-SNOM)—operating based on the electromagnetic interaction induced by a nanotip—transforms local field characteristics to far-field radiation for detection. The lateral resolution and vertical resolution of s-SNOM are 9 nm and 10 nm, respectively. The local optical characteristics of gold nanoparticle array with a gap of 10 nm between adjacent particles are resolved by s-SNOM with use of sharpened silicon tips. Specifically, the local, enhanced field—“hot spot”—is observed at the gap region and the local field direction is extracted as well. These two distinctive near-field traits are interpreted with a proposed dipole-coupling model. The findings corroborate that s-SNOM is a powerful analytical instrument to reveal optical characteristics in sub-10 nm scale and would be expectantly beneficial to the development of optical applications based on two-dimensional sub-wavelength plasmonic structures and their epistemological understanding. Jiun-Haw Lee 李君浩 2013 學位論文 ; thesis 93 zh-TW |
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博士 === 國立臺灣大學 === 光電工程學研究所 === 101 === Anomalous optical properties displayed by plasmonic structures are commonly attributed to the enhanced, local field within their corrugations. Though theoretical calculations of such field enhancements abound, experimental observations are relatively few, because only few optical microscopic techniques have enough spatial resolution. The scattering-type scanning near-field optical microscope (s-SNOM)—operating based on the electromagnetic interaction induced by a nanotip—transforms local field characteristics to far-field radiation for detection. The lateral resolution and vertical resolution of s-SNOM are 9 nm and 10 nm, respectively. The local optical characteristics of gold nanoparticle array with a gap of 10 nm between adjacent particles are resolved by s-SNOM with use of sharpened silicon tips. Specifically, the local, enhanced field—“hot spot”—is observed at the gap region and the local field direction is extracted as well. These two distinctive near-field traits are interpreted with a proposed dipole-coupling model. The findings corroborate that s-SNOM is a powerful analytical instrument to reveal optical characteristics in sub-10 nm scale and would be expectantly beneficial to the development of optical applications based on two-dimensional sub-wavelength plasmonic structures and their epistemological understanding.
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Jiun-Haw Lee |
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Jiun-Haw Lee Tian-You Cheng 鄭天佑 |
author |
Tian-You Cheng 鄭天佑 |
spellingShingle |
Tian-You Cheng 鄭天佑 Scrutinizing Au nanoparticle arrays with scattering-type scanning near-field optical microscopy |
author_sort |
Tian-You Cheng |
title |
Scrutinizing Au nanoparticle arrays with scattering-type scanning near-field optical microscopy |
title_short |
Scrutinizing Au nanoparticle arrays with scattering-type scanning near-field optical microscopy |
title_full |
Scrutinizing Au nanoparticle arrays with scattering-type scanning near-field optical microscopy |
title_fullStr |
Scrutinizing Au nanoparticle arrays with scattering-type scanning near-field optical microscopy |
title_full_unstemmed |
Scrutinizing Au nanoparticle arrays with scattering-type scanning near-field optical microscopy |
title_sort |
scrutinizing au nanoparticle arrays with scattering-type scanning near-field optical microscopy |
publishDate |
2013 |
url |
http://ndltd.ncl.edu.tw/handle/41981355563684579887 |
work_keys_str_mv |
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