An Image Processing Implemented by Detection of Chip Inductors
碩士 === 東海大學 === 電機工程學系 === 101 === This thesis is aim to quality restriction of chip bead inductor and design an image processing system. The image processing methods to be adopted into the system are binary and edge detector. The system use a CCD sensor to measure chip bead inductor with XYZ platfo...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2013
|
Online Access: | http://ndltd.ncl.edu.tw/handle/3469x2 |
id |
ndltd-TW-101THU00442010 |
---|---|
record_format |
oai_dc |
spelling |
ndltd-TW-101THU004420102019-05-15T20:52:48Z http://ndltd.ncl.edu.tw/handle/3469x2 An Image Processing Implemented by Detection of Chip Inductors 晶片型電感器之影像檢測系統 Chia-hsiang Wu 吳嘉祥 碩士 東海大學 電機工程學系 101 This thesis is aim to quality restriction of chip bead inductor and design an image processing system. The image processing methods to be adopted into the system are binary and edge detector. The system use a CCD sensor to measure chip bead inductor with XYZ platform. The XYZ positioning is driven by the motion axis stepper motor control card. The chip bead inductor are skewed defective, broken and deformed. First, I used binary and geometry algorithms to calculate the area of chip bead inductor ports to determine whether the area size is defects. As for the broken detection are used edge detector and geometry algorithms to determine whether the edge is defects. Yuc-hang Hung 黃宇中 2013 學位論文 ; thesis 83 zh-TW |
collection |
NDLTD |
language |
zh-TW |
format |
Others
|
sources |
NDLTD |
description |
碩士 === 東海大學 === 電機工程學系 === 101 === This thesis is aim to quality restriction of chip bead inductor and design an image processing system. The image processing methods to be adopted into the system are binary and edge detector.
The system use a CCD sensor to measure chip bead inductor with XYZ platform. The XYZ positioning is driven by the motion axis stepper motor control card. The chip bead inductor are skewed defective, broken and deformed. First, I used binary and geometry algorithms to calculate the area of chip bead inductor ports to determine whether the area size is defects. As for the broken detection are used edge detector and geometry algorithms to determine whether the edge is defects.
|
author2 |
Yuc-hang Hung |
author_facet |
Yuc-hang Hung Chia-hsiang Wu 吳嘉祥 |
author |
Chia-hsiang Wu 吳嘉祥 |
spellingShingle |
Chia-hsiang Wu 吳嘉祥 An Image Processing Implemented by Detection of Chip Inductors |
author_sort |
Chia-hsiang Wu |
title |
An Image Processing Implemented by Detection of Chip Inductors |
title_short |
An Image Processing Implemented by Detection of Chip Inductors |
title_full |
An Image Processing Implemented by Detection of Chip Inductors |
title_fullStr |
An Image Processing Implemented by Detection of Chip Inductors |
title_full_unstemmed |
An Image Processing Implemented by Detection of Chip Inductors |
title_sort |
image processing implemented by detection of chip inductors |
publishDate |
2013 |
url |
http://ndltd.ncl.edu.tw/handle/3469x2 |
work_keys_str_mv |
AT chiahsiangwu animageprocessingimplementedbydetectionofchipinductors AT wújiāxiáng animageprocessingimplementedbydetectionofchipinductors AT chiahsiangwu jīngpiànxíngdiàngǎnqìzhīyǐngxiàngjiǎncèxìtǒng AT wújiāxiáng jīngpiànxíngdiàngǎnqìzhīyǐngxiàngjiǎncèxìtǒng AT chiahsiangwu imageprocessingimplementedbydetectionofchipinductors AT wújiāxiáng imageprocessingimplementedbydetectionofchipinductors |
_version_ |
1719107272761671680 |