Investigation of scanning Kelvin probe microscopy on CuIn1-xGaxSe2 thin films
碩士 === 國立中興大學 === 物理學系所 === 102 === Since scanning probe microscopy (SPM) has variety of measurements and high resolution, it has been used to investigate CuIn1-xGaxSe2 (CIGS) solar cells for in the recent years. With typical characterization method and SPM, We realized the property of CIGS in dep...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/05859293833999163991 |