ESD protection design for radio-frequency integrated circuits in nanoscale CMOS technology

ESD protection design for radio-frequency integrated circuits in nanoscale CMOS technology

碩士 === 國立交通大學 === 電子工程學系電子研究所 === 102 === For the consideration of high integration and low cost, radio-frequency integrated circuits (RF ICs) have been fabricated in nanoscale CMOS processes. Electrostatic discharge (ESD), which has become one of the most important reliability issues in IC product...

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Bibliographic Details
Main Authors:	Fan, Mei-Lian, 范美蓮
Other Authors:	Ker, Ming-Dou
Format:	Others
Language:	en_US
Published:	2014
Online Access:	http://ndltd.ncl.edu.tw/handle/24460538617037423160

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